Skip to main navigation
Skip to search
Skip to main content
New Jersey Institute of Technology Home
Help & FAQ
Home
Profiles
Research units
Facilities
Federal Grants
Research output
Press/Media
Search by expertise, name or affiliation
Reflow Mechanisms of Contact Vias in VLSI Processing
R. A. Levy
, K. Nassau
Research output
:
Contribution to journal
›
Article
›
peer-review
16
Scopus citations
Overview
Fingerprint
Fingerprint
Dive into the research topics of 'Reflow Mechanisms of Contact Vias in VLSI Processing'. Together they form a unique fingerprint.
Sort by
Weight
Alphabetically
Keyphrases
Overhang
100%
Reflow
100%
Glass Thickness
60%
Sidewall
40%
Low Temperature
20%
Closely Spaced
20%
Chemical Nature
20%
Bulge
20%
Processing Parameters
20%
Glass Substrate
20%
Idealized Geometry
20%
Substrate Interface
20%
Borophosphosilicate Glass
20%
Glass Reflow
20%
Re-entrant
20%
Case Closure
20%
All-glass
20%
Engineering
Side Wall
100%
Extreme Case
100%
Low-Temperature
50%
Processing Parameter
50%
Glass Substrate
50%
Substrate Interface
50%
Intermediate Stage
50%