Review of noise sources in magnetic tunnel junction sensors

Z. Q. Lei, G. J. Li, William F. Egelhoff, P. T. Lai, Philip W.T. Pong

Research output: Contribution to journalArticlepeer-review

86 Scopus citations

Abstract

Noise problem limits the sensitivity of magnetic tunnel junction (MTJ) sensors for ultra-low magnetic field applications. Noise analysis not only helps in finding ways to eliminate noise disturbances but also essential for understanding the electronic and magnetic properties of MTJs. These approaches provide insight for optimizing the design of MTJ sensors before fabrication. This paper reviews the noise sources in MTJ sensors reported in recent years. Both the origins and mathematical derivations of the noise sources are presented, illustrating how different factors affecting the performance of MTJ sensors. A brief outlook of challenges in the future is also given.

Original languageEnglish (US)
Article number5721852
Pages (from-to)602-612
Number of pages11
JournalIEEE Transactions on Magnetics
Volume47
Issue number3
DOIs
StatePublished - Mar 2011
Externally publishedYes

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

Keywords

  • 1/f noise
  • Johnson noise
  • magnetic noise
  • magnetic tunnel junction (MTJ)
  • shot noise
  • thermal noise

Fingerprint

Dive into the research topics of 'Review of noise sources in magnetic tunnel junction sensors'. Together they form a unique fingerprint.

Cite this