Revisiting the Behavior of the E-Region Electron Temperature During Strong Electric Field Events at High Latitudes

J. P. St-Maurice, L. Goodwin

Research output: Contribution to journalArticlepeer-review

9 Scopus citations

Abstract

A rich data set acquired during a long-lived strong electric field event by the north-facing Resolute Bay incoherent scatter radar confirms and strengthens conclusions previously drawn from several less comprehensive studies of E-region electron heating by large amplitude Farley-Buneman waves. For the exceptionally abundant set of very good quality data we uncovered, the E-region electron temperature response to strong ambient electric fields is described very accurately by a simple linear function of the electric field at 110 and 117 km altitudes. The linear dependence starts at 40 mV/m and shows no hint of deviating from the linear response up to 150 mV/m (the maximum electric field observed during this event). Based on this new evidence, we have revisited previous E-region electron temperature observations from various altitudes and have built a model that is consistent with present and past observations. The model is made of simple linear variations in the electron temperature with slopes that depend on altitude. It should prove to be a useful reference for anyone interested in the E-region electron temperature anywhere between 100 and 120 km altitudes.

Original languageEnglish (US)
Article number2020JA028288
JournalJournal of Geophysical Research: Space Physics
Volume126
Issue number2
DOIs
StatePublished - Feb 2021

All Science Journal Classification (ASJC) codes

  • Space and Planetary Science
  • Geophysics

Keywords

  • E-region disturbance under strong electric field conditions
  • E-region electron heating by plasma waves
  • E-region electron temperatures
  • Farley-Buneman turbulence

Fingerprint

Dive into the research topics of 'Revisiting the Behavior of the E-Region Electron Temperature During Strong Electric Field Events at High Latitudes'. Together they form a unique fingerprint.

Cite this