Abstract
This paper uses the STUMPS architecture to study the properties of a new diagnostic procedure. According to the old procedure the process stops at the end of each test window to compare the measured signature against its precomputed value. The old procedure also calls for the abandonment of all future test windows after the first failing one is encountered. This is due to the unavailability of expected future test window signatures in the presence of a previously captured error. This paper shows a simple method of salvaging future test windows by adjusting their expected signatures to fit past observed errors. Experiments conducted using this new procedure reveals an improvement of at least one order of magnitude in diagnostic resolution over what has been previously experienced.
| Original language | English (US) |
|---|---|
| Pages | 416-425 |
| Number of pages | 10 |
| State | Published - 1997 |
| Event | Proceedings of the 1997 15th VLSI Test Symposium - Monterey, CA, USA Duration: Apr 27 1997 → May 1 1997 |
Other
| Other | Proceedings of the 1997 15th VLSI Test Symposium |
|---|---|
| City | Monterey, CA, USA |
| Period | 4/27/97 → 5/1/97 |
All Science Journal Classification (ASJC) codes
- Computer Science Applications
- Electrical and Electronic Engineering