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Scan-Based Transition Test
Jacob Savir
, Srinivas Patil
Research output
:
Contribution to journal
›
Article
›
peer-review
153
Scopus citations
Overview
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Dive into the research topics of 'Scan-Based Transition Test'. Together they form a unique fingerprint.
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Keyphrases
Transition Test
100%
Skewed-load Tests
57%
Load Transition
42%
One-bit
28%
Transition Faults
28%
Scan Chain
28%
Delay Test
28%
Bit Shift
28%
Detection Probability
14%
Combinational Logic
14%
Fault Coverage
14%
Test Quality
14%
Shift Pattern
14%
Transition Probability
14%
Fault Feature Enhancement
14%
Calculus Detection
14%
Computer Science
Scan Chain
100%
Detection Probability
50%
Combinational Logic
50%
Fault Coverage
50%