We have used a pulsed electron beam in a scanning electron microscope to produce highly localized (∼1 μm) changes in the electrical properties of a heterogeneous thin film of YBa2Cu3O7-δ. The predominant effect of the beam is to locally heat the film, producing a measurable shift in the current-voltage characteristic. In particular, we have precisely located the part of the film responsible for a sharp feature in the current-voltage characteristic corresponding to a single Josephson junction. The technique should also be useful more generally in identifying specific weak links in superconducting thin films.
|Original language||English (US)|
|Number of pages||3|
|Journal||Applied Physics Letters|
|State||Published - 1988|
All Science Journal Classification (ASJC) codes
- Physics and Astronomy (miscellaneous)