Scanning tunneling microscope tip structures

Ruth Nicolaides, Yong Liang, William E. Packard, Zhou Wu Fu, Howard A. Blackstead, K. K. Chin, John D. Dow, Jacek K. Furdyna, Wei Min Hu, Robert C. Jaklevic, Mary V. Zeller, William J. Kaiser, Alan R. Pelton, Joseph Bellina

Research output: Contribution to journalArticlepeer-review

35 Scopus citations


Studies of electrochemically etched tungsten scanning tunneling microscope tips, using scanning electron microscopy, show that (i) the tips are often convolved or bent if the mass of the tungsten wire submerged in the etchant is large (an effect ascribed to surface plastic flow), (ii) bent tips nevertheless often produce good quality scanning tunneling microscopy images of Au films in air, but (iii) tips, once crashed clumsily into the Au films, no longer produce images.

Original languageEnglish (US)
Pages (from-to)445-447
Number of pages3
JournalJournal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Issue number2
StatePublished - Mar 1988
Externally publishedYes

All Science Journal Classification (ASJC) codes

  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films


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