Abstract
Studies of electrochemically etched tungsten scanning tunneling microscope tips, using scanning electron microscopy, show that (i) the tips are often convolved or bent if the mass of the tungsten wire submerged in the etchant is large (an effect ascribed to surface plastic flow), (ii) bent tips nevertheless often produce good quality scanning tunneling microscopy images of Au films in air, but (iii) tips, once crashed clumsily into the Au films, no longer produce images.
Original language | English (US) |
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Pages (from-to) | 445-447 |
Number of pages | 3 |
Journal | Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films |
Volume | 6 |
Issue number | 2 |
DOIs | |
State | Published - Mar 1988 |
Externally published | Yes |
All Science Journal Classification (ASJC) codes
- Condensed Matter Physics
- Surfaces and Interfaces
- Surfaces, Coatings and Films