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Self-heating effects on hot carrier degradation and its impact on ring-oscillator reliability

  • P. Paliwoda
  • , Z. Chbili
  • , A. Kerber
  • , T. Nigam
  • , D. Singh
  • , K. Nagahiro
  • , P. P. Manik
  • , S. Cimino
  • , D. Misra

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

4   Link opens in a new tab Scopus citations

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Material Science