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Self-heating effects on hot carrier degradation and its impact on ring-oscillator reliability
P. Paliwoda, Z. Chbili, A. Kerber, T. Nigam, D. Singh, K. Nagahiro, P. P. Manik, S. Cimino, D. Misra
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
4
Scopus
citations