Self-heating effects on hot carrier degradation and its impact on ring-oscillator reliability

P. Paliwoda, Z. Chbili, A. Kerber, T. Nigam, D. Singh, K. Nagahiro, P. P. Manik, S. Cimino, D. Misra

Research output: Chapter in Book/Report/Conference proceedingConference contribution

5 Scopus citations

Fingerprint

Dive into the research topics of 'Self-heating effects on hot carrier degradation and its impact on ring-oscillator reliability'. Together they form a unique fingerprint.

Keyphrases

Engineering

Material Science