Self-heating effects on hot carrier degradation and its impact on logic circuit reliability

Peter Paliwoda, Zakariae Chbili, Andreas Kerber, Tanya Nigam, K. Nagahiro, Salvatore Cimino, Maria Toledano-Luque, Luigi Pantisano, Byoung Woon Min, Durgamadhab Misra

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16 Scopus citations

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Material Science

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Engineering