Fingerprint
Dive into the research topics of 'Self-heating effects on hot carrier degradation and its impact on logic circuit reliability'. Together they form a unique fingerprint.- Sort by
- Weight
- Alphabetically
Self-heating effects on hot carrier degradation and its impact on logic circuit reliability
Peter Paliwoda, Zakariae Chbili, Andreas Kerber, Tanya Nigam, K. Nagahiro, Salvatore Cimino, Maria Toledano-Luque, Luigi Pantisano, Byoung Woon Min, Durgamadhab Misra
Research output: Contribution to journal › Article › peer-review
17
Scopus
citations