Semiconductor steady state defect effective Fermi level and deep level transient spectroscopy depth profiling

Engineering & Materials Science

• Deep level transient spectroscopy 100%
• Fermi level 97%
• Depth profiling 92%
• Semiconductor materials 49%
• Defects 38%
• Free energy 13%
• Electron energy levels 13%
• Computer simulation 6%

Chemical Compounds

• Deep Level Transient Spectroscopy 94%
• Depth Profiling 70%
• Fermi Level 65%
• Semiconductor 42%
• Defect Level 34%
• Selection Rule 14%
• Gibbs Free Energy 8%
• Simulation 7%

Physics & Astronomy

• defects 31%
• spectroscopy 29%
• p-n junctions 6%
• depletion 5%
• free energy 5%
• energy levels 5%
• computerized simulation 5%