SERIAL IMPLEMENTATION OF MEASURING THE WEIGHTED SYNDROME SUMS.

Jacob Savir, M. G. Smith

Research output: Contribution to journalArticlepeer-review

Abstract

The weighted syndrome sums approach to VLSI testing is applicable to self-testing, where the number of syndrome references needed to be stored in an on-chip ROS is kept minimum. A serial process and the hardware implementation of it which computes the weighted syndrome sums is described.

Original languageEnglish (US)
Pages (from-to)4066-4069
Number of pages4
JournalIBM technical disclosure bulletin
Volume27
Issue number7 A
StatePublished - Dec 1 1984
Externally publishedYes

All Science Journal Classification (ASJC) codes

  • Engineering(all)

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