The weighted syndrome sums approach to VLSI testing is applicable to self-testing, where the number of syndrome references needed to be stored in an on-chip ROS is kept minimum. A serial process and the hardware implementation of it which computes the weighted syndrome sums is described.
|Original language||English (US)|
|Number of pages||4|
|Journal||IBM technical disclosure bulletin|
|Issue number||7 A|
|State||Published - Dec 1 1984|
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