Skip to main navigation
Skip to search
Skip to main content
New Jersey Institute of Technology Home
Help & FAQ
Home
Profiles
Research units
Facilities
Federal Grants
Research output
Press/Media
Search by expertise, name or affiliation
Short-lived absorptive type III-like microwave bursts as A signature of fragmented electron injections
Bin Chen
, Yihua Yan
Research output
:
Contribution to journal
›
Article
›
peer-review
7
Scopus citations
Overview
Fingerprint
Fingerprint
Dive into the research topics of 'Short-lived absorptive type III-like microwave bursts as A signature of fragmented electron injections'. Together they form a unique fingerprint.
Sort by
Weight
Alphabetically
Keyphrases
Electron Beam
100%
Electron Injection
100%
Loss Cone
100%
Microwave Bursts
100%
Release Process
50%
Energy Release
50%
Broadband Radio
50%
Reconnection
50%
High Temporal Resolution
50%
Type III Radio Bursts
50%
Numerical Investigation
50%
Wavelength Range
50%
Instantaneous Bandwidth
50%
High Spectral Resolution
50%
Instrumental Resolution
50%
Radio Spectrometer
50%
Absorption Depth
50%
Low Frequency Region
50%
Starting Frequency
50%
Drift Rate
50%
Reverse Drift
50%
Earth and Planetary Sciences
Electron Beam
100%
Spectral Resolution
50%
Type 3 Burst
50%
Drift Rate
50%
Physics
Electron Beam
100%
Drift Rate
50%