Soft-mode phonons in SrTiO3 thin films studied by far-infrared ellipsometry and Raman scattering

A. A. Sirenko, C. Bernhard, A. Golnik, I. A. Akimov, A. M. Clark, J. H. Hao, X. X. Xi

Research output: Contribution to journalConference articlepeer-review

1 Scopus citations

Abstract

We report the experimental studies of the vibrational spectra of SrTiO3 films with the thickness of 1 μm grown by pulsed laser deposition. Fourier-transform infrared ellipsometry between 30 and 700 cm-1 and electric field-induced Raman scattering have been utilized for investigation of the phonon behavior. These results can be used for comparison with the low-frequency measurements of the static dielectric constant. In the films, the soft mode reveals hardening compared to that in bulk crystals. This observation is in agreement with the Lyddane-Sachs-Teller formalism.

Original languageEnglish (US)
Pages (from-to)245-250
Number of pages6
JournalMaterials Research Society Symposium - Proceedings
Volume603
StatePublished - 2000
Externally publishedYes
EventMaterials issues for Tunable RF and Microwave Devices - Boston, MA, USA
Duration: Nov 30 1999Dec 2 1999

All Science Journal Classification (ASJC) codes

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

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