Soft-mode phonons in SrTiO3 thin films studied by far-infrared ellipsometry and Raman scattering

A. A. Sirenko; C. Bernhard; A. Golnik; I. A. Akimov; A. M. Clark; J. H. Hao; X. X. Xi

Soft-mode phonons in SrTiO₃ thin films studied by far-infrared ellipsometry and Raman scattering

A. A. Sirenko, C. Bernhard, A. Golnik, I. A. Akimov, A. M. Clark, J. H. Hao, X. X. Xi

Research output: Contribution to journal › Conference article › peer-review

Abstract

We report the experimental studies of the vibrational spectra of SrTiO₃ films with the thickness of 1 μm grown by pulsed laser deposition. Fourier-transform infrared ellipsometry between 30 and 700 cm^-1 and electric field-induced Raman scattering have been utilized for investigation of the phonon behavior. These results can be used for comparison with the low-frequency measurements of the static dielectric constant. In the films, the soft mode reveals hardening compared to that in bulk crystals. This observation is in agreement with the Lyddane-Sachs-Teller formalism.

Original language	English (US)
Pages (from-to)	245-250
Number of pages	6
Journal	Materials Research Society Symposium - Proceedings
Volume	603
State	Published - 2000
Externally published	Yes
Event	Materials issues for Tunable RF and Microwave Devices - Boston, MA, USA Duration: Nov 30 1999 → Dec 2 1999

All Science Journal Classification (ASJC) codes

General Materials Science
Condensed Matter Physics
Mechanics of Materials
Mechanical Engineering

Cite this

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title = "Soft-mode phonons in SrTiO3 thin films studied by far-infrared ellipsometry and Raman scattering",

abstract = "We report the experimental studies of the vibrational spectra of SrTiO3 films with the thickness of 1 μm grown by pulsed laser deposition. Fourier-transform infrared ellipsometry between 30 and 700 cm-1 and electric field-induced Raman scattering have been utilized for investigation of the phonon behavior. These results can be used for comparison with the low-frequency measurements of the static dielectric constant. In the films, the soft mode reveals hardening compared to that in bulk crystals. This observation is in agreement with the Lyddane-Sachs-Teller formalism.",

author = "Sirenko, {A. A.} and C. Bernhard and A. Golnik and Akimov, {I. A.} and Clark, {A. M.} and Hao, {J. H.} and Xi, {X. X.}",

year = "2000",

language = "English (US)",

volume = "603",

pages = "245--250",

journal = "Materials Research Society Symposium - Proceedings",

issn = "0272-9172",

publisher = "Materials Research Society",

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TY - JOUR

T1 - Soft-mode phonons in SrTiO3 thin films studied by far-infrared ellipsometry and Raman scattering

AU - Sirenko, A. A.

AU - Bernhard, C.

AU - Golnik, A.

AU - Akimov, I. A.

AU - Clark, A. M.

AU - Hao, J. H.

AU - Xi, X. X.

PY - 2000

Y1 - 2000

N2 - We report the experimental studies of the vibrational spectra of SrTiO3 films with the thickness of 1 μm grown by pulsed laser deposition. Fourier-transform infrared ellipsometry between 30 and 700 cm-1 and electric field-induced Raman scattering have been utilized for investigation of the phonon behavior. These results can be used for comparison with the low-frequency measurements of the static dielectric constant. In the films, the soft mode reveals hardening compared to that in bulk crystals. This observation is in agreement with the Lyddane-Sachs-Teller formalism.

AB - We report the experimental studies of the vibrational spectra of SrTiO3 films with the thickness of 1 μm grown by pulsed laser deposition. Fourier-transform infrared ellipsometry between 30 and 700 cm-1 and electric field-induced Raman scattering have been utilized for investigation of the phonon behavior. These results can be used for comparison with the low-frequency measurements of the static dielectric constant. In the films, the soft mode reveals hardening compared to that in bulk crystals. This observation is in agreement with the Lyddane-Sachs-Teller formalism.

UR - http://www.scopus.com/inward/record.url?scp=0033678128&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0033678128&partnerID=8YFLogxK

M3 - Conference article

AN - SCOPUS:0033678128

SN - 0272-9172

VL - 603

SP - 245

EP - 250

JO - Materials Research Society Symposium - Proceedings

JF - Materials Research Society Symposium - Proceedings

T2 - Materials issues for Tunable RF and Microwave Devices

Y2 - 30 November 1999 through 2 December 1999

ER -

Soft-mode phonons in SrTiO₃ thin films studied by far-infrared ellipsometry and Raman scattering

Abstract

All Science Journal Classification (ASJC) codes

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