Split-drain magnetic field-effect transistor channel charge trapping and stress induced sensitivity deterioration

  • Zhenyi Yang
  • , Sik Lam Siu
  • , Wing Shan Tam
  • , Chi Wah Kok
  • , Chi Wah Leung
  • , P. T. Lai
  • , Hei Wong
  • , Wing Man Tang
  • , P. W.T. Pong

Research output: Contribution to journal › Article › peer-review

5 Scopus citations

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Engineering

Material Science