Steganalysis Effective to JPEG Images Based on Statistical Moments of DCT 2-D Array, its Prediction-error 2-D Array, and Their Wavelet Subbands

Yun-Qing Shi; ChunHua Chen

Steganalysis Effective to JPEG Images Based on Statistical Moments of DCT 2-D Array, its Prediction-error 2-D Array, and Their Wavelet Subbands

Yun-Qing Shi (Inventor), ChunHua Chen (Inventor)

New Jersey Institute of Technology

Research output: Innovation › Patent

Abstract

https://www.google.com/patents/US7925080

Original language	English (US)
State	Published - Sep 2018

Keywords

Patent Issued

Cite this

@misc{4305437e3064469ba30c1ac3ac2838d7,

title = "Steganalysis Effective to JPEG Images Based on Statistical Moments of DCT 2-D Array, its Prediction-error 2-D Array, and Their Wavelet Subbands",

abstract = "https://www.google.com/patents/US7925080",

keywords = "Patent Issued",

author = "Yun-Qing Shi and ChunHua Chen",

year = "2018",

month = sep,

language = "English (US)",

type = "Patent",

}

TY - PAT

T1 - Steganalysis Effective to JPEG Images Based on Statistical Moments of DCT 2-D Array, its Prediction-error 2-D Array, and Their Wavelet Subbands

AU - Shi, Yun-Qing

AU - Chen, ChunHua

PY - 2018/9

Y1 - 2018/9

N2 - https://www.google.com/patents/US7925080

AB - https://www.google.com/patents/US7925080

KW - Patent Issued

UR - http://njit.technologypublisher.com/technology/28774

M3 - Patent

ER -

Steganalysis Effective to JPEG Images Based on Statistical Moments of DCT 2-D Array, its Prediction-error 2-D Array, and Their Wavelet Subbands

Abstract

Keywords

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