Strain relaxation and surface migration effects in InGaAlAs and InGaAsP selective-area-grown ridge waveguides

  • A. A. Sirenko
  • , A. Kazimirov
  • , A. Ougazzaden
  • , S. M. O'Malley
  • , D. H. Bilderback
  • , Z. H. Cai
  • , B. Lai
  • , R. Huang
  • , V. K. Gupta
  • , M. Chien
  • , S. N.G. Chu

Research output: Contribution to journalArticlepeer-review

19 Scopus citations

Abstract

Surface migration of the group-III precursors and strain relaxation at the ridge sidewalls are compared for 2.5 μm wide waveguides based on InGaAsP and InGaAlAs multiple-quantum-well (MQW) structures. The cross-sectional thickness and strain variations have been measured using synchrotron radiation-based x-ray diffraction with an angular resolution of 2 arc s and a beam size of (0.24×0.35) μ m2. Indium-rich overgrowth has been observed for the InGaAsP-based waveguides, while InGaAlAs-based waveguides demonstrate thickness uniformity of the MQW active region with a strain relief of 0.4%μm at the sidewalls.

Original languageEnglish (US)
Article number081111
JournalApplied Physics Letters
Volume88
Issue number8
DOIs
StatePublished - 2006

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy (miscellaneous)

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