Structural and electrical properties of Hg_xZn_1-xS thin films prepared by flash evaporation technique

Keyphrases

• Absorption Edge 33%
• Absorption Measurement 33%
• Alloy Films 33%
• Angstrom 66%
• Atomic Fraction 33%
• Average Grain Size 33%
• C(X) 33%
• DC Conductivity 33%
• Electrical Properties 100%
• Electron Diffraction 33%
• Flash Evaporation 100%
• Grain-boundary Conduction 33%
• Lattice Parameter 66%
• Mercury 33%
• Mercury Concentration 100%
• Optical Absorption 33%
• Resistive Behavior 33%
• Resistivity 66%
• Resistivity Measurement 33%
• Resistivity Value 33%
• Room Temperature 33%
• Single Crystal 33%
• Single-phase Alloy 33%
• Structural Properties 100%
• Substrate Temperature 33%
• Sulfide Films 33%
• Ternary Alloys 33%
• Zinc Sulfide 33%

Engineering

• Absorption Edge 50%
• Absorption Measurement 50%
• Alloy Phase 50%
• Average Grain Size 50%
• Bcc Structure 50%
• Electron Diffraction 50%
• Grain Boundary 50%
• Lattice Parameter 100%
• Resistive 50%
• Room Temperature 50%
• Substrate Temperature 50%
• Ternary Alloy 50%
• Thin Films 100%

Material Science

• Electrical Resistivity 40%
• Electron Diffraction 10%
• Film 100%
• Grain Boundary 10%
• Grain Size 10%
• Lattice Constant 20%
• Single Crystal 10%
• Ternary Alloy 10%
• Thin Films 100%