Keyphrases
Metal Organic Vapor Phase Epitaxy (MOVPE)
100%
GaN Layers
100%
Morphological Study
100%
GaN Thin Film
100%
LiNbO3 Substrate
100%
Scattering Measurements
66%
Raman Scattering
33%
Atomic Force Microscope
33%
Crystal Orientation
33%
Frequency Shift
33%
X Ray Diffraction
33%
Raman Spectra
33%
Scanning Electron Microscope
33%
Axis Orientation
33%
X-ray Diffraction (XRD) Analysis
33%
Smooth Surface
33%
Epilayer
33%
Growth Form
33%
Micro-Raman Scattering
33%
Columnar Growth
33%
Relative Frequency
33%
Relative Intensity
33%
Growth Feature
33%
In-plane Orientation
33%
Ex Situ Characterization
33%
Lithium Niobate Substrate
33%
GaN Epilayer
33%
Deposition Layer
33%
Epitaxial GaN
33%
Engineering
Thin Films
100%
Atomic Force Microscope
100%
Ray Diffraction
100%
Crystallographic Orientation
100%
Raman Spectrum
100%
Frequency Shift
100%
Smooth Surface
100%
Scanning Electron Microscope
100%
X-Ray Diffraction Analysis
100%
Growth Mode
100%
Material Science
Thin Films
100%
Morphology
100%
Vapor Phase Epitaxy
100%
Epilayers
100%
Density
50%
Scanning Electron Microscopy
50%
X-Ray Diffraction
50%
X Ray Diffraction Analysis
50%
Lithium Niobate
50%
Physics
Thin Films
100%
Raman Spectra
100%
Vapor Phase Epitaxy
100%
X Ray Diffraction
33%
Frequency Shift
33%
Electron Microscope
33%
X-Ray Diffraction
33%