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Structural characterization of nc-si/a-sio2 superlattices subjected to thermal treatment
G. F. Grom
,
L. Tsybeskov
, K. D. Hirschman
, P. M. Fauchet
, J. P. McCaffrey
, H. J. Labbé
, D. J. Lockwood
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Keyphrases
Structural Characterization
100%
Thermal Treatment
100%
Si Nanocrystals
100%
Superlattices
100%
Silica
100%
Defect Density
16%
Raman Spectroscopy
16%
Atomic Force Microscopy
16%
Crystal Orientation
16%
Optical Phonons
16%
Acoustic Phonons
16%
High-temperature Annealing
16%
Transmission Electron Microscopy
16%
Packing Density
16%
Oxidation Time
16%
Si02
16%
Interface Abruptness
16%
Oxidation at High Temperature
16%
Material Science
Superlattice
100%
Nanocrystalline
100%
Oxidation Reaction
75%
Nanocrystalline Material
50%
Density
25%
Transmission Electron Microscopy
25%
Defect Density
25%
Raman Spectroscopy
25%
Amorphous Material
25%