Abstract
Structural modifications in nanocrystalline silicon-silicon dioxide (nc-Si/SiO:) superlattices (SL) under high intensity laser irradiation have been studied experimentally and theoretically. The melting threshold in nc-Si/SiO2 SLs was found in the range of 5-8 kW/cm2 for cw excitation by 514 nm line of Ar+ laser and ∼11-15 mJ/cm 2 for pulsed irradiation by 248 nm, τ∼20 ns KrF laser. The irradiation of the samples above the melting threshold induces the irreversible modification of nc-Si layers, which is controlled by the thickness of the separating SiO2 layers, and increases the PL intensity increases by more than 300%.
Original language | English (US) |
---|---|
Article number | F7.26 |
Pages (from-to) | 219-224 |
Number of pages | 6 |
Journal | Materials Research Society Symposium Proceedings |
Volume | 832 |
State | Published - 2005 |
Event | 2004 MRS Fall Meeting - Boston, MA, United States Duration: Nov 29 2004 → Dec 2 2004 |
All Science Journal Classification (ASJC) codes
- General Materials Science
- Condensed Matter Physics
- Mechanics of Materials
- Mechanical Engineering