Studies on the use of liquid surface passivation for lifetime measurements on good-quality silicon wafers

S. Devayajanam, P. Rupnowski, S. Shet, B. L. Sopori, N. M. Ravindra, D. Caskey, J. Chang, J. Covington

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Scopus citations

Abstract

We evaluated several liquid passivants, viz. solutions of iodine ethanol (IE), quinhydrone methanol (QHM), and potassium cyanide (KCN), for measuring minority-carrier lifetime. Lifetime was measured by the WCT-100 (Sinton Instruments) and WT-2000 (Semilab). Our results show that both IE and QHM passivation are reliable mechanisms. We also find that the KCN solution is moderately passivating on oxidized surfaces, but is only minimally effective on bare Si surfaces. This paper presents details of our studies. In particular, the effect of illumination on IE-passivated surfaces and possible reasons for variations in lifetime measurement are discussed.

Original languageEnglish (US)
Title of host publicationProgram - 37th IEEE Photovoltaic Specialists Conference, PVSC 2011
Pages1647-1651
Number of pages5
DOIs
StatePublished - Dec 1 2011
Event37th IEEE Photovoltaic Specialists Conference, PVSC 2011 - Seattle, WA, United States
Duration: Jun 19 2011Jun 24 2011

Publication series

NameConference Record of the IEEE Photovoltaic Specialists Conference
ISSN (Print)0160-8371

Other

Other37th IEEE Photovoltaic Specialists Conference, PVSC 2011
CountryUnited States
CitySeattle, WA
Period6/19/116/24/11

All Science Journal Classification (ASJC) codes

  • Control and Systems Engineering
  • Industrial and Manufacturing Engineering
  • Electrical and Electronic Engineering

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