Studies on the use of liquid surface passivation for lifetime measurements on good-quality silicon wafers

S. Devayajanam; P. Rupnowski; S. Shet; B. L. Sopori; N. M. Ravindra; D. Caskey; J. Chang; J. Covington

doi:10.1109/PVSC.2011.6186272

Studies on the use of liquid surface passivation for lifetime measurements on good-quality silicon wafers

S. Devayajanam, P. Rupnowski, S. Shet, B. L. Sopori, N. M. Ravindra, D. Caskey, J. Chang, J. Covington

Physics

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

2 Scopus citations

Abstract

We evaluated several liquid passivants, viz. solutions of iodine ethanol (IE), quinhydrone methanol (QHM), and potassium cyanide (KCN), for measuring minority-carrier lifetime. Lifetime was measured by the WCT-100 (Sinton Instruments) and WT-2000 (Semilab). Our results show that both IE and QHM passivation are reliable mechanisms. We also find that the KCN solution is moderately passivating on oxidized surfaces, but is only minimally effective on bare Si surfaces. This paper presents details of our studies. In particular, the effect of illumination on IE-passivated surfaces and possible reasons for variations in lifetime measurement are discussed.

Original language	English (US)
Title of host publication	Program - 37th IEEE Photovoltaic Specialists Conference, PVSC 2011
Pages	1647-1651
Number of pages	5
DOIs	https://doi.org/10.1109/PVSC.2011.6186272
State	Published - 2011
Event	37th IEEE Photovoltaic Specialists Conference, PVSC 2011 - Seattle, WA, United States Duration: Jun 19 2011 → Jun 24 2011

Publication series

Name	Conference Record of the IEEE Photovoltaic Specialists Conference
ISSN (Print)	0160-8371

Other

Other	37th IEEE Photovoltaic Specialists Conference, PVSC 2011
Country/Territory	United States
City	Seattle, WA
Period	6/19/11 → 6/24/11

All Science Journal Classification (ASJC) codes

Control and Systems Engineering
Industrial and Manufacturing Engineering
Electrical and Electronic Engineering

Access to Document

10.1109/PVSC.2011.6186272

Cite this

Devayajanam, S., Rupnowski, P., Shet, S., Sopori, B. L., Ravindra, N. M., Caskey, D., Chang, J., & Covington, J. (2011). Studies on the use of liquid surface passivation for lifetime measurements on good-quality silicon wafers. In Program - 37th IEEE Photovoltaic Specialists Conference, PVSC 2011 (pp. 1647-1651). Article 6186272 (Conference Record of the IEEE Photovoltaic Specialists Conference). https://doi.org/10.1109/PVSC.2011.6186272

@inproceedings{2f21600f626343efa0c2c88daf0d8c55,

title = "Studies on the use of liquid surface passivation for lifetime measurements on good-quality silicon wafers",

abstract = "We evaluated several liquid passivants, viz. solutions of iodine ethanol (IE), quinhydrone methanol (QHM), and potassium cyanide (KCN), for measuring minority-carrier lifetime. Lifetime was measured by the WCT-100 (Sinton Instruments) and WT-2000 (Semilab). Our results show that both IE and QHM passivation are reliable mechanisms. We also find that the KCN solution is moderately passivating on oxidized surfaces, but is only minimally effective on bare Si surfaces. This paper presents details of our studies. In particular, the effect of illumination on IE-passivated surfaces and possible reasons for variations in lifetime measurement are discussed.",

author = "S. Devayajanam and P. Rupnowski and S. Shet and Sopori, {B. L.} and Ravindra, {N. M.} and D. Caskey and J. Chang and J. Covington",

year = "2011",

doi = "10.1109/PVSC.2011.6186272",

language = "English (US)",

isbn = "9781424499656",

series = "Conference Record of the IEEE Photovoltaic Specialists Conference",

pages = "1647--1651",

booktitle = "Program - 37th IEEE Photovoltaic Specialists Conference, PVSC 2011",

note = "37th IEEE Photovoltaic Specialists Conference, PVSC 2011 ; Conference date: 19-06-2011 Through 24-06-2011",

}

Devayajanam, S, Rupnowski, P, Shet, S, Sopori, BL, Ravindra, NM, Caskey, D, Chang, J & Covington, J 2011, Studies on the use of liquid surface passivation for lifetime measurements on good-quality silicon wafers. in Program - 37th IEEE Photovoltaic Specialists Conference, PVSC 2011., 6186272, Conference Record of the IEEE Photovoltaic Specialists Conference, pp. 1647-1651, 37th IEEE Photovoltaic Specialists Conference, PVSC 2011, Seattle, WA, United States, 6/19/11. https://doi.org/10.1109/PVSC.2011.6186272

Studies on the use of liquid surface passivation for lifetime measurements on good-quality silicon wafers. / Devayajanam, S.; Rupnowski, P.; Shet, S. et al.
Program - 37th IEEE Photovoltaic Specialists Conference, PVSC 2011. 2011. p. 1647-1651 6186272 (Conference Record of the IEEE Photovoltaic Specialists Conference).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

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AU - Devayajanam, S.

AU - Rupnowski, P.

AU - Shet, S.

AU - Sopori, B. L.

AU - Ravindra, N. M.

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AU - Chang, J.

AU - Covington, J.

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AB - We evaluated several liquid passivants, viz. solutions of iodine ethanol (IE), quinhydrone methanol (QHM), and potassium cyanide (KCN), for measuring minority-carrier lifetime. Lifetime was measured by the WCT-100 (Sinton Instruments) and WT-2000 (Semilab). Our results show that both IE and QHM passivation are reliable mechanisms. We also find that the KCN solution is moderately passivating on oxidized surfaces, but is only minimally effective on bare Si surfaces. This paper presents details of our studies. In particular, the effect of illumination on IE-passivated surfaces and possible reasons for variations in lifetime measurement are discussed.

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Devayajanam S, Rupnowski P, Shet S, Sopori BL, Ravindra NM, Caskey D et al. Studies on the use of liquid surface passivation for lifetime measurements on good-quality silicon wafers. In Program - 37th IEEE Photovoltaic Specialists Conference, PVSC 2011. 2011. p. 1647-1651. 6186272. (Conference Record of the IEEE Photovoltaic Specialists Conference). doi: 10.1109/PVSC.2011.6186272

Studies on the use of liquid surface passivation for lifetime measurements on good-quality silicon wafers

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