Studies on the use of liquid surface passivation for lifetime measurements on good-quality silicon wafers

S. Devayajanam, P. Rupnowski, S. Shet, B. L. Sopori, N. M. Ravindra, D. Caskey, J. Chang, J. Covington

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Scopus citations

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Engineering & Materials Science