Submicron beam X-ray diffraction of nanoheteroepitaxily grown GaN: Experimental challenges and calibration procedures

P. L. Bonanno, S. Gautier, A. A. Sirenko, A. Kazimirov, Z. H. Cai, W. H. Goh, J. Martin, A. Martinez, T. Moudakir, N. Maloufi, M. B. Assouar, A. Ramdane, L. Le Gratiet, A. Ougazzaden

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