TY - GEN
T1 - Subpixel edge estimation using geometrical edge models with noise miniaturization
AU - Hung, D. C.D.
AU - Mitchell, O. R.
N1 - Publisher Copyright:
© 1994 IEEE.
PY - 1995
Y1 - 1995
N2 - The significant disadvantage for traditional contour representation is as the resolution is reduced the effort of undersampling is proportional enlarged. The goal of this study is to improve edge detection results, especially for those corner points in low resolution. This study describes a method, which is based on 4-connected pixel-wise linearization, for finding contours from low resolution video images. This allows a more accurate inspection and identification of objects from image data. In practice, geometrical models are used to manipulate this linearization. A method is employed for examining the corner points as well.
AB - The significant disadvantage for traditional contour representation is as the resolution is reduced the effort of undersampling is proportional enlarged. The goal of this study is to improve edge detection results, especially for those corner points in low resolution. This study describes a method, which is based on 4-connected pixel-wise linearization, for finding contours from low resolution video images. This allows a more accurate inspection and identification of objects from image data. In practice, geometrical models are used to manipulate this linearization. A method is employed for examining the corner points as well.
UR - http://www.scopus.com/inward/record.url?scp=11444270235&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=11444270235&partnerID=8YFLogxK
U2 - 10.1109/IAI.1994.336673
DO - 10.1109/IAI.1994.336673
M3 - Conference contribution
AN - SCOPUS:11444270235
T3 - Proceedings of the IEEE Southwest Symposium on Image Analysis and Interpretation
SP - 112
EP - 117
BT - Proceedings of the IEEE Southwest Symposium on Image Analysis and Interpretation, IAI 1994
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 1995 IEEE Southwest Symposium on Image Analysis and Interpretation, IAI 1994
Y2 - 21 April 1994 through 24 April 1994
ER -