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Classical testing of combinational circuits requires a list of the fault-free response of the circuit to the test set. For most practical circuits implemented today the large storage requirement for such a list makes such a test procedure very expensive. This paper describes a method of designing combinational circuits in such a way that their test procedure will require the knowledge of only one characteristic of the fault-free circuit, called the syndrome. This solves the storage problem associated with the test procedure. It is shown that the syndrome-testable design is inexpensive and can be easily implemented by the logic designer.

Original languageEnglish (US)
Pages (from-to)137-140
Number of pages4
JournalProceedings - Annual International Conference on Fault-Tolerant Computing
StatePublished - 1979
Externally publishedYes
EventProc Annu Int Conf Fault Tolerant Comput 9th, Dig of Pap - Madison, WI, USA
Duration: Jun 20 1979Jun 22 1979

All Science Journal Classification (ASJC) codes

  • Hardware and Architecture


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