Syndrome-Testable Design of Combinational Circuits

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Abstract

Classical testing of combinational circuits requires a list of the fault-free response of the circuit to the test set. For most practical circuits implemented today the large storage requirement for such a list makes such a test procedure very expensive. Moreover, the computational cost to generate the test set increases exponentially with the circuit size. In this paper we describe a method of designing combinational circuits in such a way that their test procedure will require the knowledge of only one characteristic of the fault-free circuit, called the syndrome. This solves the storage problem associated with the test procedure. The syndrome-test procedure does not require test vector generation, and thus the expensive stage of test generation and fault simulation is eliminated.

Original languageEnglish (US)
Pages (from-to)442-451
Number of pages10
JournalIEEE Transactions on Computers
VolumeC-29
Issue number6
DOIs
StatePublished - Jun 1980
Externally publishedYes

All Science Journal Classification (ASJC) codes

  • Software
  • Theoretical Computer Science
  • Hardware and Architecture
  • Computational Theory and Mathematics

Keywords

  • Combinational circuit
  • fan-out-free circuit
  • minterm
  • prime implicant
  • single fault
  • stuck-at fault

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