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Syndrome-Testable Design of Combinational Circuits
Jacob Savir
Research output
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Contribution to journal
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Article
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peer-review
120
Scopus citations
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Dive into the research topics of 'Syndrome-Testable Design of Combinational Circuits'. Together they form a unique fingerprint.
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Mathematics
Design
48%
Test Set
34%
Fault
30%
Fault Simulation
26%
Test Generation
23%
Computational Cost
13%
Requirements
10%
Knowledge
9%
Testing
9%
Engineering & Materials Science
Combinatorial circuits
100%
Networks (circuits)
42%
Testing
10%
Costs
7%