TY - GEN
T1 - Test generators need to be modified to handle CMOS designs
AU - Savir, Jacob
N1 - Publisher Copyright:
© 1997 IEEE.
PY - 1997
Y1 - 1997
N2 - CMOS designs have some unique properties that prevent existing test generators from computing a test vector for a fault when one might exist. The problem lies in the premises laid out on what it takes to detect a stuck-at fault. The basic premise that states that it is required to set a line to 0(1) in order to detect a stuck-at 1(0) fault, and then propagate the error to an observable point, is not a necessary and sufficient detection condition. This is due to the existence of unknown states throughout the logic. This paper shows an example to illustrate the problem; describes what it takes in order to remedy it; proposes possible enhancements to existing test generation algorithms, and outlines the risks faced in the event that no correcting steps are taken.
AB - CMOS designs have some unique properties that prevent existing test generators from computing a test vector for a fault when one might exist. The problem lies in the premises laid out on what it takes to detect a stuck-at fault. The basic premise that states that it is required to set a line to 0(1) in order to detect a stuck-at 1(0) fault, and then propagate the error to an observable point, is not a necessary and sufficient detection condition. This is due to the existence of unknown states throughout the logic. This paper shows an example to illustrate the problem; describes what it takes in order to remedy it; proposes possible enhancements to existing test generation algorithms, and outlines the risks faced in the event that no correcting steps are taken.
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U2 - 10.1109/IMTC.1997.612437
DO - 10.1109/IMTC.1997.612437
M3 - Conference contribution
AN - SCOPUS:0030676931
T3 - Conference Record - IEEE Instrumentation and Measurement Technology Conference
SP - 1436
EP - 1441
BT - IMTC 1997 - IEEE Instrumentation and Measurement Technology Conference
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 14th Annual IEEE Instrumentation and Measurement Technology Conference, IMTC 1997
Y2 - 19 May 1997 through 21 May 1997
ER -