Test limitations of parametric faults in analog circuits

J. Savir, Z. Guo

Research output: Chapter in Book/Report/Conference proceedingConference contribution

12 Scopus citations

Abstract

This paper investigates the detectability of parameter faults in linear, time-invariant, analog circuits. We show that there are inherent limitations with regard to analog faults detectability.

Original languageEnglish (US)
Title of host publicationProceedings of the 11th Asian Test Symposium, ATS 2002
PublisherIEEE Computer Society
Pages39-44
Number of pages6
ISBN (Electronic)0769518257, 0769518257
DOIs
StatePublished - Jan 1 2002
Event11th Asian Test Symposium, ATS 2002 - Guam, United States
Duration: Nov 18 2002Nov 20 2002

Publication series

NameProceedings of the Asian Test Symposium
Volume2002-January
ISSN (Print)1081-7735

Other

Other11th Asian Test Symposium, ATS 2002
Country/TerritoryUnited States
CityGuam
Period11/18/0211/20/02

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering

Keywords

  • Analog circuits
  • Circuit faults
  • Circuit testing
  • DVD

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