@inproceedings{45f1f747b84746f5ac5e18df0b967a54,
title = "Test limitations of parametric faults in analog circuits",
abstract = "This paper investigates the detectability of parameter faults in linear, time-invariant, analog circuits. We show that there are inherent limitations with regard to analog faults detectability.",
keywords = "Analog circuits, Circuit faults, Circuit testing, DVD",
author = "J. Savir and Z. Guo",
note = "Publisher Copyright: {\textcopyright} 2002 IEEE.; 11th Asian Test Symposium, ATS 2002 ; Conference date: 18-11-2002 Through 20-11-2002",
year = "2002",
doi = "10.1109/ATS.2002.1181682",
language = "English (US)",
series = "Proceedings of the Asian Test Symposium",
publisher = "IEEE Computer Society",
pages = "39--44",
booktitle = "Proceedings of the 11th Asian Test Symposium, ATS 2002",
address = "United States",
}