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Test limitations of parametric faults in analog circuits
J. Savir
, Z. Guo
Electrical and Computer Engineering
Research output
:
Chapter in Book/Report/Conference proceeding
›
Conference contribution
13
Scopus citations
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Keyphrases
Analog Circuits
100%
Parametric Faults
100%
Linear Time Invariant
50%
Analog Faults
50%
Fault Detectability
50%
Mathematics
Detectability
100%
Parametric
100%
Linear Time
50%
Computer Science
Analog Circuit
100%