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Test limitations of parametric faults in analog circuits
Jacob Savir
, Zhen Guo
Electrical and Computer Engineering
Research output
:
Contribution to journal
›
Article
›
peer-review
31
Scopus citations
Overview
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Dive into the research topics of 'Test limitations of parametric faults in analog circuits'. Together they form a unique fingerprint.
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Keyphrases
Analog Circuits
100%
Parametric Faults
100%
Size Parameter
33%
Minimum Size
22%
Parameter Drift
22%
Testing Method
11%
Linear Time Invariant
11%
Parameter-free
11%
Fault Coverage
11%
Fault-free
11%
Analog Faults
11%
Fault Detectability
11%
Fault Masking
11%
Parameter Tolerance
11%
Normal Parameters
11%
Specification Compliance
11%
Test Efficiency
11%
Test Attribute
11%
Mathematics
Parametric
100%
Detectability
50%
drift parameter μ
50%
Linear Time
25%
Counterexample
25%
Free Parameter
25%
Figure of Merit
25%
Computer Science
Analog Circuit
100%
Size Parameter
60%
Test Methodology
20%
Free Parameter
20%
Fault Coverage
20%
Requirement Specification
20%
Biochemistry, Genetics and Molecular Biology
Masking
100%