@inproceedings{055a801a44c74a69aa6d8cd5a494943d,
title = "Testing for coupled cells in random-access memories",
abstract = "Five test strategies for memory testing are compared for their ability to detect coupled-cell faults in an n-word-by-1-b random-access memory. In all five test strategies the data-in line is randomly driven. Three of five strategies use random selection of both the address lines and the read/write control. The other two strategies sequentially cycle through the address space with deterministic setting of the read/write control. The relative merit of these five strategies is measured by the average number of accesses per address needed to meet a standard test quality level. It is concluded that ETWO (explicit memory test with word operations) offers the best performance and is quite easy to implement.",
author = "J. Savir and McAnney, {W. H.} and Vecchio, {S. R.}",
year = "1989",
language = "English (US)",
isbn = "0818689625",
series = "20 Int Test Conf 1989 ITC",
publisher = "Publ by IEEE",
pages = "439--451",
editor = "Anon",
booktitle = "20 Int Test Conf 1989 ITC",
note = "20th International Test Conference 1989 (ITC) ; Conference date: 29-08-1989 Through 31-08-1989",
}