Abstract
Since the cost of detecting and isolating intermittent faults in digital systems comprises a major part of the total testing cost, efficient methods to detect them are required. An optimal algorithm is proposed for testing for intermittent faults in combinational circuits which are vital parts of any computing system. The underlying optimality criterion is to minimize the mean testing time and still guarantee a given escape probability. This goal is achieved by applying input vectors with an optimal probability distribution.
| Original language | English (US) |
|---|---|
| Pages | 155-161 |
| Number of pages | 7 |
| State | Published - 1978 |
| Externally published | Yes |
| Event | USA - Jpn Comput Conf Proc, 3rd - San Francisco, CA, USA Duration: Oct 10 1978 → Oct 12 1978 |
Conference
| Conference | USA - Jpn Comput Conf Proc, 3rd |
|---|---|
| City | San Francisco, CA, USA |
| Period | 10/10/78 → 10/12/78 |
All Science Journal Classification (ASJC) codes
- General Engineering