Testing for Single Intermittent Failures in Combinational Circuits by Maximizing the Probability of Fault Detection

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Abstract

Intermittent faults in combinational circuits may appear and disappear randomly; hence, their detection requires many repeated applications of test vectors. Since testing reduces the time available for computation, it is necessary to efficiently minimize the time required for a test, while still achieving a high degree of fault detection. This paper presents an optimal random test procedure to detect intermittent failures. The algorithm maximizes the probability of fault detection byoptimally choosing the input vector probabilities.

Original languageEnglish (US)
Pages (from-to)410-416
Number of pages7
JournalIEEE Transactions on Computers
VolumeC-29
Issue number5
DOIs
StatePublished - May 1980
Externally publishedYes

All Science Journal Classification (ASJC) codes

  • Software
  • Theoretical Computer Science
  • Hardware and Architecture
  • Computational Theory and Mathematics

Keywords

  • Error latency
  • intermittent fault detection
  • irredundant circuit
  • maximum likelihood estimator
  • random testing

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