TY - JOUR
T1 - The Bayes decision rule induced similarity measures
AU - Liu, Chengjun
N1 - Funding Information:
The author would like to thank the anonymous reviewers for their critical and constructive comments and suggestions. This work was partially supported by the NJCST/NJIT grant and by Award No. 2006-IJ-CX-K033 awarded by the National Institute of Justice, Office of Justice Programs, US Department of Justice. The opinions, findings, and conclusions or recommendations expressed in this publication are those of the author and do not necessarily reflect those of the US Department of Justice.
Copyright:
Copyright 2008 Elsevier B.V., All rights reserved.
PY - 2007/6
Y1 - 2007/6
N2 - This paper first shows that the popular whitened cosine similarity measure is related to the Bayes decision rule under specific assumptions and then presents two new similarity measures: the PRM Whitened Cosine (PWC) similarity measure and the Within-Class Whitened Cosine (WWC) similarity measure. Experiments on face recognition using the Face Recognition Grand Challenge (FRGC) version 2 database show the effectiveness of the new measures.
AB - This paper first shows that the popular whitened cosine similarity measure is related to the Bayes decision rule under specific assumptions and then presents two new similarity measures: the PRM Whitened Cosine (PWC) similarity measure and the Within-Class Whitened Cosine (WWC) similarity measure. Experiments on face recognition using the Face Recognition Grand Challenge (FRGC) version 2 database show the effectiveness of the new measures.
KW - Face Recognition Grand Challenge (FRGC)
KW - PRM Whitened Cosine (PWC) similarity measure
KW - Whitened cosine similarity measure
KW - Within-Class Whitened Cosine (WWC) similarity measure
UR - http://www.scopus.com/inward/record.url?scp=34247557078&partnerID=8YFLogxK
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U2 - 10.1109/TPAMI.2007.1063
DO - 10.1109/TPAMI.2007.1063
M3 - Article
C2 - 17431305
AN - SCOPUS:34247557078
SN - 0162-8828
VL - 29
SP - 1086
EP - 1090
JO - IEEE Transactions on Pattern Analysis and Machine Intelligence
JF - IEEE Transactions on Pattern Analysis and Machine Intelligence
IS - 6
ER -