Abstract
This paper describes a new type of shift register latch that is compatible with LSSD. The new latch has the property that information may be shifted in and out of it in two directions: Left to right and right to left. It is shown that if used in LSSD it will greatly simplify the problem of shift register failure diagnostics. The cost of introducing bidirectional capability to LSSD is minimal in hardware overhead and does not have an adverse effect on either the machine speed or its component wireability. Copyright 1986 by The Institute of Electrical and Electronics Engineers, Inc.
Original language | English (US) |
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Pages (from-to) | 65-66 |
Number of pages | 2 |
Journal | IEEE Transactions on Computers |
Volume | C-35 |
Issue number | 1 |
DOIs | |
State | Published - Jan 1986 |
Externally published | Yes |
All Science Journal Classification (ASJC) codes
- Software
- Theoretical Computer Science
- Hardware and Architecture
- Computational Theory and Mathematics
Keywords
- Design for testability
- LSSD
- hardware overhead
- shift register failure diagnostics
- shift register latch