TY - CHAP
T1 - The Interaction of Light with Solids
T2 - An Overview of Optical Characterization
AU - Diebold, Alain
AU - Hofmann, Tino
N1 - Publisher Copyright:
© 2021, Springer Nature Switzerland AG.
PY - 2021
Y1 - 2021
N2 - In this chapter, we cover the basic principles involved in the interaction of light with crystals, thin films, and nanoscale materials necessary for discussing optical characterization. We discuss Fresnel’s equations for bulk materials and thin films on substrates. The Fresnel equations for isotropic, uniaxial, and biaxial materials are all presented in terms of the complex refractive index. This chapter introduces ellipsometric characterization of the dielectric function of nanoscale materials, and it also discusses Raman spectroscopy and photoluminescence of 2D materials.
AB - In this chapter, we cover the basic principles involved in the interaction of light with crystals, thin films, and nanoscale materials necessary for discussing optical characterization. We discuss Fresnel’s equations for bulk materials and thin films on substrates. The Fresnel equations for isotropic, uniaxial, and biaxial materials are all presented in terms of the complex refractive index. This chapter introduces ellipsometric characterization of the dielectric function of nanoscale materials, and it also discusses Raman spectroscopy and photoluminescence of 2D materials.
UR - https://www.scopus.com/pages/publications/85122909484
UR - https://www.scopus.com/pages/publications/85122909484#tab=citedBy
U2 - 10.1007/978-3-030-80323-0_1
DO - 10.1007/978-3-030-80323-0_1
M3 - Chapter
AN - SCOPUS:85122909484
T3 - Springer Series in Materials Science
SP - 1
EP - 60
BT - Springer Series in Materials Science
PB - Springer Science and Business Media Deutschland GmbH
ER -