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The structure and stability of β-Ta thin films
Aiqin Jiang
,
Trevor A. Tyson
,
Lisa Axe
, Leszek Gladczuk
, Marek Sosnowski
, Paul Cote
Physics
Chemical and Materials Engineering
Electrical and Computer Engineering
Research output
:
Contribution to journal
›
Article
›
peer-review
61
Scopus citations
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Keyphrases
Ta Films
100%
Molecular Dynamics Simulation
50%
Crystalline Structure
50%
Single Crystal
50%
Deposition Conditions
50%
Magnetron Sputtering
50%
Silicon Dioxide
50%
X-ray Diffraction Measurement
50%
Tetragonal
50%
Embedded Atom Method
50%
Tantalum Cluster
50%
Frank-Kasper Structures
50%
DSPACE
50%
Structure Phase
50%
Relative Intensity
50%
Diffraction Data
50%
Two-peak
50%
Weak Reflection
50%
Physics
Thin Films
100%
Single Crystal
100%
Crystal Structure
100%
Molecular Dynamics
100%
X Ray Diffraction
100%
Silicon Dioxide
100%
Silica
100%
Embedded Atom Method
100%
Magnetron Sputtering
100%
Material Science
Film
100%
Thin Films
100%
Crystal Structure
25%
Single Crystal
25%
Silicon Dioxide
25%
Magnetron Sputtering
25%
Diffraction Measurement
25%
X-Ray Diffraction
25%
Tantalum
25%
Silicon Steel
25%
Agricultural and Biological Sciences
X-Ray Diffraction
100%
Microwave Oven
100%
Silicon Dioxide
100%
Chemical Engineering
Silica
100%
Magnetron Sputtering
100%