THERE IS INFORMATION IN FAULTY SIGNATURES.

W. H. McAnney, Jacob Savir

Research output: Chapter in Book/Report/Conference proceedingConference contribution

45 Scopus citations

Abstract

When signature analysis is used and an incorrect signature is observed, it is necessary, for diagnostic purposes, to identify the failing tests. A method is described for this purpose that uses only operations on the signature of the fault-free circuit and the observed incorrect signature. Because of the limited information content of these signatures, the method may cause diagnostic aliasing, i. e. , multiple failing tests to alias to fewer failing tests. The probability of such diagnostic aliasing is shown. The method is applicable to single-input and multiple-input signature analyzers.

Original languageEnglish (US)
Title of host publicationDigest of Papers - International Test Conference
PublisherIEEE
Pages630-636
Number of pages7
ISBN (Print)081860798X
StatePublished - Dec 1 1987
Externally publishedYes
EventDig Pap Int Test Conf 1987, Proc, Integr of Test with Des and Manuf - Washington, DC, USA
Duration: Sep 1 1987Sep 3 1987

Other

OtherDig Pap Int Test Conf 1987, Proc, Integr of Test with Des and Manuf
CityWashington, DC, USA
Period9/1/879/3/87

All Science Journal Classification (ASJC) codes

  • Engineering(all)

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