Abstract
When signature analysis is used and an incorrect signature is observed, it is necessary, for diagnostic purposes, to identify the failing tests. A method is described for this purpose that uses only operations on the signature of the fault-free circuit and the observed incorrect signature. Because of the limited information content of these signatures, the method may cause diagnostic aliasing, i. e. , multiple failing tests to alias to fewer failing tests. The probability of such diagnostic aliasing is shown. The method is applicable to single-input and multiple-input signature analyzers.
| Original language | English (US) |
|---|---|
| Title of host publication | Digest of Papers - International Test Conference |
| Publisher | IEEE |
| Pages | 630-636 |
| Number of pages | 7 |
| ISBN (Print) | 081860798X |
| State | Published - Dec 1 1987 |
| Externally published | Yes |
| Event | Dig Pap Int Test Conf 1987, Proc, Integr of Test with Des and Manuf - Washington, DC, USA Duration: Sep 1 1987 → Sep 3 1987 |
Other
| Other | Dig Pap Int Test Conf 1987, Proc, Integr of Test with Des and Manuf |
|---|---|
| City | Washington, DC, USA |
| Period | 9/1/87 → 9/3/87 |
All Science Journal Classification (ASJC) codes
- Engineering(all)