TY - GEN
T1 - THERE IS INFORMATION IN FAULTY SIGNATURES.
AU - McAnney, W. H.
AU - Savir, J.
PY - 1987
Y1 - 1987
N2 - When signature analysis is used and an incorrect signature is observed, it is necessary, for diagnostic purposes, to identify the failing tests. A method is described for this purpose that uses only operations on the signature of the fault-free circuit and the observed incorrect signature. Because of the limited information content of these signatures, the method may cause diagnostic aliasing, i. e. , multiple failing tests to alias to fewer failing tests. The probability of such diagnostic aliasing is shown. The method is applicable to single-input and multiple-input signature analyzers.
AB - When signature analysis is used and an incorrect signature is observed, it is necessary, for diagnostic purposes, to identify the failing tests. A method is described for this purpose that uses only operations on the signature of the fault-free circuit and the observed incorrect signature. Because of the limited information content of these signatures, the method may cause diagnostic aliasing, i. e. , multiple failing tests to alias to fewer failing tests. The probability of such diagnostic aliasing is shown. The method is applicable to single-input and multiple-input signature analyzers.
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M3 - Conference contribution
AN - SCOPUS:0023531337
SN - 081860798X
T3 - Digest of Papers - International Test Conference
SP - 630
EP - 636
BT - Digest of Papers - International Test Conference
PB - IEEE
T2 - Dig Pap Int Test Conf 1987, Proc, Integr of Test with Des and Manuf
Y2 - 1 September 1987 through 3 September 1987
ER -