Thermal characterization of diamond films through modulated photothermal radiometry

Thomas Guillemet, Andrzej Kusiak, Lisha Fan, Jean Marc Heintz, Namas Chandra, Yunshen Zhou, Jean François Silvain, Yongfeng Lu, Jean Luc Battaglia

Research output: Contribution to journalArticlepeer-review

6 Scopus citations


Diamond (Dia) films are promising heat-dissipative materials for electronic packages because they combine high thermal conductivity with high electrical resistivity. However, precise knowledge of the thermal properties of the diamond films is crucial to their potential application as passive thermal management substrates in electronics. In this study, modulated photothermal radiometry in a front-face configuration was employed to thermally characterize polycrystalline diamond films deposited onto silicon (Si) substrates through laser-assisted combustion synthesis. The intrinsic thermal conductivity of diamond films and the thermal boundary resistance at the interface between the diamond film and the Si substrate were investigated. The results enlighten the correlation between the deposition process, film purity, film transverse thermal conductivity, and interface thermal resistance.

Original languageEnglish (US)
Pages (from-to)2095-2102
Number of pages8
JournalACS Applied Materials and Interfaces
Issue number3
StatePublished - Feb 12 2014
Externally publishedYes

All Science Journal Classification (ASJC) codes

  • General Materials Science


  • diamond films
  • heat conduction
  • interface
  • laser-assisted combustion synthesis


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