Time-resolved photoluminescence measurements in spark-processed blue and green emitting silicon

R. E. Hummel, M. H. Ludwig, S. S. Chang, P. M. Fauchet, Ju V. Vandyshev, L. Tsybeskov

Research output: Contribution to journalArticlepeer-review

23 Scopus citations

Abstract

Time-resolved photoluminescence (PL) measurements on spark-processed Si (sp-Si) are compared with those on dry-oxidized porous Si (p-Si). Both types of substances yield non-exponential decay times in the nanosecond region which are essentially independent of the detection wavelength. However, subtle differences between photoluminescing sp-Si and oxidized p-Si exist. Specifically, blue/violet emitting sp-Si has a peak wavelength near 410 nm (3eV) under steady state conditions whereas oxidized p-Si luminesces with a maximum centred around 460-480 nm (2.7 - 2.58eV). Further differences include the peak structures in the PL spectra, the decay dynamics, and certain features in the lifetime distribution. It is concluded from the data that sp-Si and p-Si derive their PL from somewhat different mechanisms. Moreover, differences in decay times between SiO2 and sp-Si suggest that silica does not seem to be the major cause for PL in sp-Si.

Original languageEnglish (US)
Pages (from-to)553-557
Number of pages5
JournalSolid State Communications
Volume95
Issue number8
DOIs
StatePublished - Aug 1995
Externally publishedYes

All Science Journal Classification (ASJC) codes

  • Chemistry(all)
  • Condensed Matter Physics
  • Materials Chemistry

Keywords

  • A. nanostructures
  • B. nanofabrication
  • D. optical properties
  • E. luminescence
  • a. semiconductors

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