TY - GEN
T1 - TIPI
T2 - 2023 IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR 2023
AU - Nguyen, A. Tuan
AU - Nguyen-Tang, Thanh
AU - Lim, Ser Nam
AU - Torr, Philip H.S.
N1 - Publisher Copyright:
© 2023 IEEE.
PY - 2023
Y1 - 2023
N2 - When deploying a machine learning model to a new environment, we often encounter the distribution shift problem - meaning the target data distribution is different from the model's training distribution. In this paper, we assume that labels are not provided for this new domain, and that we do not store the source data (e.g., for privacy reasons). It has been shown that even small shifts in the data distribution can affect the model's performance severely. Test Time Adaptation offers a means to combat this problem, as it allows the model to adapt during test time to the new data distribution, using only unlabeled test data batches. To achieve this, the predominant approach is to optimize a surrogate loss on the test-time unlabeled target data. In particular, minimizing the prediction's entropy on target samples [34] has received much interest as it is task-agnostic and does not require altering the model's training phase (e.g., does not require adding a self-supervised task during training on the source domain). However, as the target data's batch size is often small in real-world scenarios (e.g., autonomous driving models process each few frames in real-time), we argue that this surrogate loss is not optimal since it often collapses with small batch sizes. To tackle this problem, in this paper, we propose to use an invariance regularizer as the surrogate loss during test-time adaptation, motivated by our theoretical results regarding the model's performance under input transformations. The resulting method (TIPI-Test time adaPtation with transformation Invariance) is validated with extensive experiments in various benchmarks (Cifar10-C, Cifar100-C, ImageNet-C, DIGITS, and VisDA17). Remarkably, TIPI is robust against small batch sizes (as small as 2 in our experiments), and consistently outperforms TENT [34] in all settings. Our code is released at https://github.com/atuannguyen/TIPI.
AB - When deploying a machine learning model to a new environment, we often encounter the distribution shift problem - meaning the target data distribution is different from the model's training distribution. In this paper, we assume that labels are not provided for this new domain, and that we do not store the source data (e.g., for privacy reasons). It has been shown that even small shifts in the data distribution can affect the model's performance severely. Test Time Adaptation offers a means to combat this problem, as it allows the model to adapt during test time to the new data distribution, using only unlabeled test data batches. To achieve this, the predominant approach is to optimize a surrogate loss on the test-time unlabeled target data. In particular, minimizing the prediction's entropy on target samples [34] has received much interest as it is task-agnostic and does not require altering the model's training phase (e.g., does not require adding a self-supervised task during training on the source domain). However, as the target data's batch size is often small in real-world scenarios (e.g., autonomous driving models process each few frames in real-time), we argue that this surrogate loss is not optimal since it often collapses with small batch sizes. To tackle this problem, in this paper, we propose to use an invariance regularizer as the surrogate loss during test-time adaptation, motivated by our theoretical results regarding the model's performance under input transformations. The resulting method (TIPI-Test time adaPtation with transformation Invariance) is validated with extensive experiments in various benchmarks (Cifar10-C, Cifar100-C, ImageNet-C, DIGITS, and VisDA17). Remarkably, TIPI is robust against small batch sizes (as small as 2 in our experiments), and consistently outperforms TENT [34] in all settings. Our code is released at https://github.com/atuannguyen/TIPI.
KW - continual
KW - low-shot
KW - meta
KW - or long-tail learning
KW - Transfer
UR - https://www.scopus.com/pages/publications/85180080585
UR - https://www.scopus.com/pages/publications/85180080585#tab=citedBy
U2 - 10.1109/CVPR52729.2023.02314
DO - 10.1109/CVPR52729.2023.02314
M3 - Conference contribution
AN - SCOPUS:85180080585
SN - 9798350301298
T3 - Proceedings of the IEEE Computer Society Conference on Computer Vision and Pattern Recognition
SP - 24162
EP - 24171
BT - Proceedings - 2023 IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR 2023
PB - IEEE Computer Society
Y2 - 18 June 2023 through 22 June 2023
ER -