Abstract
Mercury emissions from industrial stacks pose a hazardous threat to human being. Conventional methods of atomic absorption and plasma emission spectroscopy have their limitations. In order to develop a sensitive real-time measurement approach for industrial applications, an ultraviolet interferometer system capable of Fourier transform spectrochemical measurements has been preliminary studied in our laboratory. Though interferometry approach is mostly used in infrared, the interferometer we developed has showed its great potential for application in atomic emission detection in ultraviolet. We have set up the interferometer in Michelson configuration. Light source of our choice is low pressure mercury pen lamp which provides strong atomic mercury emissions at 253.7nm. Fringe patterns at 253.7nm and 546.1nm were pictured by a charge-coupled-device (CCD) camera. Moving fringes was generated by linear displacement of the movable mirror of the Michelson interferometer. The interferograms at both ultraviolet and visible regions of atomic mercury emission spectrum were recorded. Based on the translation function of movable mirror, wavelength information is retrieved from the interferogram. The error of experimental resolved wavelength is within 2%.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 98-102 |
| Number of pages | 5 |
| Journal | Proceedings of SPIE - The International Society for Optical Engineering |
| Volume | 4201 |
| DOIs | |
| State | Published - 2001 |
| Event | Optical Methods for Industrial Processes - Boston, MA, United States Duration: Nov 6 2000 → Nov 7 2000 |
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Computer Science Applications
- Applied Mathematics
- Electrical and Electronic Engineering
Keywords
- CCD
- Detection
- Fringe
- Interferometry
- Mercury
- Spectroscopy
- Ultraviolet