VLSI SELF-TESTING BASED ON SYNDROME TECHNIQUES.

Z. Barzilai, J. Savir, G. Markowsky, M. G. Smith

Research output: Contribution to conference › Paper › peer-review

5 Scopus citations
Original languageEnglish (US)
Pages102-109
Number of pages8
StatePublished - 1981
Externally publishedYes

All Science Journal Classification (ASJC) codes

  • General Engineering

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