VLSI SELF-TESTING BASED ON SYNDROME TECHNIQUES.

  • Z. Barzilai
  • , J. Savir
  • , G. Markowsky
  • , M. G. Smith

Research output: Contribution to conference › Paper › peer-review

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Original languageEnglish (US)
Pages102-109
Number of pages8
StatePublished - 1981
Externally publishedYes

All Science Journal Classification (ASJC) codes

  • General Engineering

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