VLSI SELF-TESTING BASED ON SYNDROME TECHNIQUES.

Z. Barzilai, J. Savir, G. Markowsky, M. G. Smith

Research output: Contribution to conference › Paper › peer-review

5 Scopus citations

Fingerprint

Dive into the research topics of 'VLSI SELF-TESTING BASED ON SYNDROME TECHNIQUES.'. Together they form a unique fingerprint.