Voltage dependent quantum efficiency measurement in property study of thin film solar cells

Zhi Peng Huang; Shou Ren Zhao; Lei Sun; Peng Chao Sun; Chuan Jun Zhang; Yun Hua Wu; Hong Cao; Shan Li Wang; Zhi Gao Hu; Ping Xiong Yang; Jun Hao Chu

doi:10.3724/SP.J.1010.2014.00395

Voltage dependent quantum efficiency measurement in property study of thin film solar cells

Zhi Peng Huang, Shou Ren Zhao, Lei Sun, Peng Chao Sun, Chuan Jun Zhang, Yun Hua Wu, Hong Cao, Shan Li Wang, Zhi Gao Hu, Ping Xiong Yang, Jun Hao Chu

Research output: Contribution to journal › Article › peer-review

2 Scopus citations

Abstract

Quantum efficiency measured at different voltage varies in a wide range. Compensation of the window layer, quality of the main junction and the value of back contact barrier can be derived from the voltage dependent quantum efficiency at different wavelength region. Depletion width and diffusion length of the minority carrier can be calculated from the apparent quantum efficiency. Relationship of the depletion width, diffusion length of the minority carrier and apparent quantum efficiency is presented in the article. A new method to calculate the depletion width and diffusion length of the minority carrier is proposed. Furthermore, we discussed the feasibility of studying thin film solar cells via its voltage dependent quantum efficiency.

Original language	English (US)
Pages (from-to)	395-399
Number of pages	5
Journal	Hongwai Yu Haomibo Xuebao/Journal of Infrared and Millimeter Waves
Volume	33
Issue number	4
DOIs	https://doi.org/10.3724/SP.J.1010.2014.00395
State	Published - Aug 1 2014
Externally published	Yes

All Science Journal Classification (ASJC) codes

Atomic and Molecular Physics, and Optics

Keywords

Depletion width
Minority carrier diffusion length
Thin film solar cells
Voltage dependent quantum efficiency

Access to Document

10.3724/SP.J.1010.2014.00395

Cite this

@article{792c4a9256d54ff7972bbd72fe4932a5,

title = "Voltage dependent quantum efficiency measurement in property study of thin film solar cells",

abstract = "Quantum efficiency measured at different voltage varies in a wide range. Compensation of the window layer, quality of the main junction and the value of back contact barrier can be derived from the voltage dependent quantum efficiency at different wavelength region. Depletion width and diffusion length of the minority carrier can be calculated from the apparent quantum efficiency. Relationship of the depletion width, diffusion length of the minority carrier and apparent quantum efficiency is presented in the article. A new method to calculate the depletion width and diffusion length of the minority carrier is proposed. Furthermore, we discussed the feasibility of studying thin film solar cells via its voltage dependent quantum efficiency.",

keywords = "Depletion width, Minority carrier diffusion length, Thin film solar cells, Voltage dependent quantum efficiency",

author = "Huang, {Zhi Peng} and Zhao, {Shou Ren} and Lei Sun and Sun, {Peng Chao} and Zhang, {Chuan Jun} and Wu, {Yun Hua} and Hong Cao and Wang, {Shan Li} and Hu, {Zhi Gao} and Yang, {Ping Xiong} and Chu, {Jun Hao}",

year = "2014",

month = aug,

day = "1",

doi = "10.3724/SP.J.1010.2014.00395",

language = "English (US)",

volume = "33",

pages = "395--399",

journal = "Hongwai Yu Haomibo Xuebao/Journal of Infrared and Millimeter Waves",

issn = "1001-9014",

publisher = "Chinese Optical Society",

number = "4",

}

TY - JOUR

T1 - Voltage dependent quantum efficiency measurement in property study of thin film solar cells

AU - Huang, Zhi Peng

AU - Zhao, Shou Ren

AU - Sun, Lei

AU - Sun, Peng Chao

AU - Zhang, Chuan Jun

AU - Wu, Yun Hua

AU - Cao, Hong

AU - Wang, Shan Li

AU - Hu, Zhi Gao

AU - Yang, Ping Xiong

AU - Chu, Jun Hao

PY - 2014/8/1

Y1 - 2014/8/1

N2 - Quantum efficiency measured at different voltage varies in a wide range. Compensation of the window layer, quality of the main junction and the value of back contact barrier can be derived from the voltage dependent quantum efficiency at different wavelength region. Depletion width and diffusion length of the minority carrier can be calculated from the apparent quantum efficiency. Relationship of the depletion width, diffusion length of the minority carrier and apparent quantum efficiency is presented in the article. A new method to calculate the depletion width and diffusion length of the minority carrier is proposed. Furthermore, we discussed the feasibility of studying thin film solar cells via its voltage dependent quantum efficiency.

AB - Quantum efficiency measured at different voltage varies in a wide range. Compensation of the window layer, quality of the main junction and the value of back contact barrier can be derived from the voltage dependent quantum efficiency at different wavelength region. Depletion width and diffusion length of the minority carrier can be calculated from the apparent quantum efficiency. Relationship of the depletion width, diffusion length of the minority carrier and apparent quantum efficiency is presented in the article. A new method to calculate the depletion width and diffusion length of the minority carrier is proposed. Furthermore, we discussed the feasibility of studying thin film solar cells via its voltage dependent quantum efficiency.

KW - Depletion width

KW - Minority carrier diffusion length

KW - Thin film solar cells

KW - Voltage dependent quantum efficiency

UR - http://www.scopus.com/inward/record.url?scp=84907207978&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84907207978&partnerID=8YFLogxK

U2 - 10.3724/SP.J.1010.2014.00395

DO - 10.3724/SP.J.1010.2014.00395

M3 - Article

AN - SCOPUS:84907207978

SN - 1001-9014

VL - 33

SP - 395

EP - 399

JO - Hongwai Yu Haomibo Xuebao/Journal of Infrared and Millimeter Waves

JF - Hongwai Yu Haomibo Xuebao/Journal of Infrared and Millimeter Waves

IS - 4

ER -

Voltage dependent quantum efficiency measurement in property study of thin film solar cells

Abstract

All Science Journal Classification (ASJC) codes

Keywords

Access to Document

Other files and links

Fingerprint

Cite this