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W-polycide dual-gate structure for sub- 1/4 micron low-voltage CMOS technology
J. Bevk, G. E. Georgiou, M. Frei, P. J. Silverman, E. J. Lloyd, Y. Kim, H. Luftman, M. Furtsch, T. Schiml, S. J. Hillenius
Research output: Contribution to journal › Conference article › peer-review
4
Scopus
citations