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Wafer emissivity independent temperature measurements
S. Abedrabbo
, F. M. Tong
,
N. M. Ravindra
, J. Gelpey
, S. Marcus
, A. T. Fiory
Physics
Research output
:
Contribution to journal
›
Article
›
peer-review
6
Scopus citations
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Keyphrases
Emissivity
100%
Emissometer
33%
Heavily Doped
33%
Optical Properties
33%
Rapid Thermal Processing
33%
SEMATECH
33%
Si Substrate
33%
Silica
33%
Silicon Nitride
33%
Temperature Measurement
100%
Wafer
100%
Wavelength Range
33%
Material Science
Optical Property
100%
Silicon Nitride
100%
Engineering
Emissivity
100%
Experimental Measurement
33%
Rapid Thermal Processing
33%
Si Substrate
33%