Wide Bandgap Materials for Semiconductor Devices

Kuan Wei Lee, Chuan Hsi Liu, Durga Misra

Research output: Contribution to journal › Editorial › peer-review

1 Scopus citations

Original language	English (US)
Number of pages	1
Journal	Microelectronics Reliability
Volume	91
DOIs	https://doi.org/10.1016/j.microrel.2018.10.010
State	Published - Dec 2018

All Science Journal Classification (ASJC) codes

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title = "Wide Bandgap Materials for Semiconductor Devices",

author = "Lee, {Kuan Wei} and Liu, {Chuan Hsi} and Durga Misra",

year = "2018",

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language = "English (US)",

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AU - Misra, Durga

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VL - 91

JO - Microelectronics Reliability

JF - Microelectronics Reliability

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