Wide Bandgap Materials for Semiconductor Devices

Kuan Wei Lee, Chuan Hsi Liu, Durga Misra

Research output: Contribution to journalEditorialpeer-review

1 Scopus citations
Original languageEnglish (US)
Pages (from-to)306
Number of pages1
JournalMicroelectronics Reliability
Volume91
DOIs
StatePublished - Dec 2018

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Safety, Risk, Reliability and Quality
  • Surfaces, Coatings and Films
  • Atomic and Molecular Physics, and Optics
  • Electrical and Electronic Engineering

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